BBIC - Scanning Electron Microscope (SEM)

Scanning Electron Microscopy is a technique used to see high detail under high magnification of the surface of a sample. A beam of focused electrons is scanned across the surface of an object. Emissions such as, secondary electrons from the objects are created and “bounce back” and are detected by a detector. This creates a very detailed contour map of the specimen. The SNE-4500M also has an Energy Dispersive X-Ray Spectroscopy (EDS)system attached. The EDS detects the x-rays emissions that are created when the electron beam is scanned over an object. The EDS has software that can determine which elements are present in the sample based on the x-ray emission.X-ray emission is unique to each chemical element.

SEM Manual